DocumentCode :
1544947
Title :
Application of asymptotic waveform evaluation for analysis of skin effect in lossy interconnects
Author :
Das, Sudip K. ; Smith, William T.
Author_Institution :
Sun Microsyst. Inc., Mountain View, CA, USA
Volume :
39
Issue :
2
fYear :
1997
fDate :
5/1/1997 12:00:00 AM
Firstpage :
138
Lastpage :
146
Abstract :
Asymptotic waveform evaluation (AWE) is a technique for time-domain analysis of electrical interconnects. AWE is a computationally efficient method that asymptotically approximates the response of a large system with a lower-order transfer function. Asymptotic waveform evaluation is used to analyze lossy interconnects including the skin effect. The internal impedance of the interconnect conductors varies as a function of the square root of the frequency. First, an overview of AWE is presented. The AWE formulation for modeling frequency dependent loss in the conductors is derived using two different series expansions of the system response at both s=0 and s≠0 in the Laplace domain. The expansions for s≠0 are determined using a transfer function formulated for inclusion of the frequency-dependent internal impedance. The network response is computed by extracting the dominant poles and residues using the Pade approximation. The proposed method is evaluated using time-domain examples of lossy multiconductor transmission lines
Keywords :
Laplace equations; approximation theory; electric impedance; losses; skin effect; time-domain analysis; transfer functions; transmission line theory; Laplace domain; Pade approximation; asymptotic waveform evaluation; coupled transmission lines; electrical interconnects; frequency dependent internal impedance; frequency dependent loss; interconnect conductors; lossy interconnects; lossy multiconductor transmission lines; lower-order transfer function; network response; poles; residues; series expansions; skin effect; square root; system response; time-domain analysis; Conductors; Frequency dependence; Impedance; Integrated circuit interconnections; Multiconductor transmission lines; Power transmission lines; Propagation losses; Skin effect; Time domain analysis; Transfer functions;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.584936
Filename :
584936
Link To Document :
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