Title :
Fabrication of superconductor/semiconductor quasi-monolithic devices using epitaxial liftoff technology
Author :
Qixin Huang ; Hohkawa, K.
Author_Institution :
Dept. of Electron. & Electr. Eng., Kanagawa Inst. of Technol., Japan
fDate :
6/1/1997 12:00:00 AM
Abstract :
This paper reports a study on the fabrication technology of high performance functional devices, where high temperature superconductor and compound semiconductor devices are monolithically integrated on the same substrate. We investigated optimal conditions for epitaxial liftoff process and succeeded in fabricating HTS device and GaAs MESFET on SrTiO/sub 3/ substrate without degrading characteristics of superconductor and semiconductor devices. We also carried out basic integrated circuit fabrication processes such as patterning and etching for quasi-monolithic structure. The results confirmed that fabricating high performance functional devices is feasible.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; electron device manufacture; gallium arsenide; high-temperature superconductors; semiconductor epitaxial layers; semiconductor technology; superconducting junction devices; superconductor-semiconductor boundaries; GaAs; GaAs MESFET; SrTiO/sub 3/; SrTiO/sub 3/ substrate; compound semiconductor; epitaxial liftoff technology; etching; high temperature superconductor; integrated circuit fabrication; patterning; superconductor/semiconductor quasi-monolithic device; Degradation; Fabrication; Gallium arsenide; High temperature superconductors; MESFETs; Semiconductor devices; Substrates; Superconducting devices; Superconducting epitaxial layers; Superconducting integrated circuits;
Journal_Title :
Applied Superconductivity, IEEE Transactions on