Reliability Estimation of Three Single-Phase Topologies in Grid-Connected PV Systems

Author

Chan, F. ; Calleja, H.

Author_Institution

Univ. of Quintana Roo, Chetumal, Mexico

Volume

58

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

2683

Lastpage

2689

Abstract

This paper presents the reliability estimation of the power stages in three grid-connected photovoltaic systems. The circuits analyzed are an integrated topology, a two-stage configuration, and a three-stage one, all commutating in the hard-switching mode. The reliability-related parameters, such as the failure rate, are calculated following the procedure outlined in MIL-HDBK 217. A comparison between the topologies is performed, and both the components and the stress factor with the highest contribution to the failure rate are identified. The methods to calculate junction temperature variations are included.

Keywords

invertors; photovoltaic power systems; power grids; power system reliability; MIL-HDBK 217; failure rate; grid-connected PV systems; grid-connected photovoltaic systems; hard-switching mode; integrated topology; junction temperature variations; power stages; reliability estimation; reliability-related parameters; stress factor; three single-phase topologies; two-stage configuration; Assembly; Capacitors; Circuit topology; Costs; Integrated circuit reliability; Inverters; Photovoltaic systems; Power system reliability; Solar power generation; Stress; Photovoltaic (PV) inverters; reliability;

fLanguage

English

Journal_Title

Industrial Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0278-0046

Type

jour

DOI

10.1109/TIE.2010.2060459

Filename

5518398