DocumentCode :
1545020
Title :
Frequency stability of dielectric loaded HTS microwave resonators
Author :
Gallop, J. ; Hao, L. ; Abbas, F. ; Langham, C.D.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3504
Lastpage :
3507
Abstract :
High Q dielectric loaded superconducting resonators have many potential microwave applications. A key issue for many of these is the stability with which the resonant frequencies of such resonators may be realised, for use as frequency references etc. We report experiments on a number of different resonator geometries using YBCO thick films as planar shields for composite dielectric structures. The experimental results are analysed and surface impedance data as a function of temperature and frequency is deduced for each superconductor specimen as well as real and imaginary components of the relative permittivity of each dielectric material involved in the resonators. Using these parameters predictions are made for the attainable stability in realistic resonator structures. We compare these predictions with stability requirements for a number of wide ranging and niche applications.
Keywords :
barium compounds; dielectric resonators; frequency stability; high-temperature superconductors; superconducting resonators; yttrium compounds; Q-factor; YBCO thick film; YBaCuO; composite structure; dielectric loaded HTS microwave resonator; frequency reference; frequency stability; permittivity; planar shield; superconducting resonator; surface impedance; Dielectrics; Geometry; High temperature superconductors; Image analysis; Resonant frequency; Stability; Superconducting films; Superconducting microwave devices; Thick films; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622149
Filename :
622149
Link To Document :
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