• DocumentCode
    1545055
  • Title

    Modeling and analysis of capacitances in metallic single electron tunneling structures

  • Author

    Knoll, M. ; Uhlmann, H.F. ; Gotz, M. ; Krech, W.

  • Author_Institution
    Tech. Univ. of Ilmenau, Germany
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    3524
  • Lastpage
    3527
  • Abstract
    The calculation of the capacitances between well-separated thin coplanar electrodes is of fundamental importance in single charge electronics, e.g. for optimizing the geometry of digital circuits with respect to desired coupling as well as to parasitic cross-talk capacitances. We are able to extract such capacitances from three-dimensional numerical field computations basing on the boundary element method. Our program yields relevant information about the dependence of the capacitance on geometry as verified by comparing calculated gate coupling capacitances of different types of single electron transistors with values obtained from the experiment.
  • Keywords
    boundary-elements methods; capacitance; single electron transistors; tunnel transistors; tunnelling; boundary element method; coplanar electrode; digital circuit; gate coupling capacitance; metallic single electron tunneling structure; parasitic cross-talk capacitance; single charge electronics; single electron transistor; three-dimensional numerical field computation; Data mining; Digital circuits; Electrodes; Geometry; Metal-insulator structures; Parasitic capacitance; Single electron transistors; Substrates; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.622154
  • Filename
    622154