Title :
Multilayer edge SNS SQUIDs for digital circuits
Author :
Forrester, M.G. ; Hunt, B.D. ; Talvacchio, J. ; Young, R.M. ; McCambridge, J.D.
Author_Institution :
Northrop Grumman Sci. & Technol. Center, Pittsburgh, PA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We have fabricated and characterized direct-injection High Temperature Superconducting (HTS) SQUIDs using a six-epitaxial-layer process which integrates edge geometry superconductor-normal-superconductor (SNS) junctions with an HTS ground plane. The period of the SQUID threshold curves was used to infer microstrip inductances of approximately 1 pH//spl square/ at 65 K. Total SQUID inductances as low as /spl ap/5 pH were inferred from the measured critical current modulation depth. A novel junction geometry was used in some devices to reduce the parasitic inductances of the junction leads by approximately 1 pH. Maintaining such low inductances is particularly important for Single Flux Quantum digital circuits.
Keywords :
SQUIDs; high-temperature superconductors; superconducting epitaxial layers; HTS ground plane; SFQ digital circuit; critical current modulation depth; direct injection; epitaxial layer; inductance; microstrip inductance; multilayer edge SNS SQUID; parasitic inductance; Current measurement; Digital circuits; Geometry; High temperature superconductors; Josephson junctions; Land surface temperature; Microstrip; Nonhomogeneous media; SQUIDs; Superconducting devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on