DocumentCode :
1545211
Title :
SFQ balanced comparators at a finite sampling rate
Author :
Semenov, V.K. ; Filippov, T.V. ; Polyakov, Yu.A. ; Likharev, K.K.
Author_Institution :
Dept. of Phys., State Univ. of New York, Stony Brook, NY, USA
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3617
Lastpage :
3621
Abstract :
We have extended our previous study of SFQ balanced comparators which use two overdamped Josephson junctions to (a) finite sampling rate and (b) junctions with higher critical current density. The effective width /spl Delta/I/sub x/ of the gray zone of the comparators fabricated using the niobium-trilayer technology of HYPRES, Inc. (j/sub c//spl ap/1 kA/cm/sup 2/) and Stony Brook\´s domestic planarized process (j/sub c//spl ap/5 kA/cm/sup 2/) has been measured as a function of the SFQ pulse rate (from 2.5 to 55 GHz) and temperature (from 1.6 to 4.2 K), for various drivers which determine the SFQ pulse shape and external impedance. The data have been compared with available theories of Josephson junction dynamics in the presence of thermal and quantum fluctuations. We have found that /spl Delta/I/sub x/ can be substantially reduced by using relatively broad ("soft") SFQ pulses. For high-j/sub c/ comparators fed by short (/spl sim/2-ps) SFQ pulses the temperature dependence is practically negligible, indicating the dominance of quantum fluctuations.
Keywords :
comparators (circuits); fluctuations in superconductors; superconducting junction devices; 1.6 to 4.2 K; 2 ps; 2.5 to 55 GHz; Nb; SFQ balanced comparator; critical current density; driver; dynamics; gray zone; niobium trilayer technology; overdamped Josephson junction; planarization; pulse rate; quantum fluctuations; sampling rate; thermal fluctuations; Critical current density; Fluctuations; Impedance measurement; Josephson junctions; Pulse measurements; Pulse shaping methods; Sampling methods; Shape measurement; Space vector pulse width modulation; Temperature;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622189
Filename :
622189
Link To Document :
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