• DocumentCode
    1545299
  • Title

    Dual-Frequency Distributed Feedback Laser With Optical Frequency Locked Loop for Stable Microwave Signal Generation

  • Author

    Khan, Muhammad R H ; Bernhardi, E.H. ; Marpaung, David A I ; Burla, Maurizio ; De Ridder, Rene M. ; Wörhoff, Kerstin ; Pollnau, Markus ; Roeloffzen, Chris G H

  • Author_Institution
    Telecommun. Eng. Group, Univ. of Twente, Enschede, Netherlands
  • Volume
    24
  • Issue
    16
  • fYear
    2012
  • Firstpage
    1431
  • Lastpage
    1433
  • Abstract
    We demonstrate the photonic generation of microwave signals by using a dual-frequency distributed feedback waveguide laser in ytterbium-doped aluminum oxide (Al2O3:Yb3+). An optical frequency locked loop (OFLL) was implemented to stabilize the center frequency of the microwave signal. This approach resulted in a microwave frequency at ~14 GHz with a phase noise of -75 dBc/Hz at 1 MHz offset from the center frequency. The frequency stability of the photonic microwave signal has an Allan deviation of more than 1 × 10-10 for an averaging time of 1000 s. The combination of the dual-frequency laser and the OFLL scheme holds great potential for the photonic generation and distribution of highly stable microwave or millimeter-wave signals.
  • Keywords
    aluminium compounds; distributed feedback lasers; frequency locked loops; microwave photonics; waveguide lasers; ytterbium; Al2O3:Yb3+; Allan deviation; dual-frequency distributed feedback laser; dual-frequency distributed feedback waveguide laser; dual-frequency laser; frequency 1 MHz; frequency 14 GHz; microwave signals photonic generation; millimeter-wave signals photonic generation; optical frequency locked loop; stable microwave signal generation; time 1000 s; Laser noise; Laser stability; Masers; Microwave oscillators; Optical feedback; Optical waveguides; Waveguide lasers; Dual-frequency laser; frequency stability; microwave generation; optical frequency locked loop (OFLL);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2012.2205379
  • Filename
    6221952