Title :
Analysis of open-loop tanlock carrier recovery for BPSK
Author :
Kam, Pooi Yuen ; Cheong, Tek Mun
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
fDate :
3/13/1997 12:00:00 AM
Abstract :
An approximate analysis valid for high SNR, is presented for the probability density function of the phase tracking error of the open-loop carrier recovery structure for BPSK proposed by Kam (see ibid., vol. 30, no. 23, p. 1923-4). The result is verified by computer simulations, and enables the evaluation of error probability of the tanlock structure
Keywords :
demodulation; error analysis; phase shift keying; probability; BPSK; approximate analysis; error probability evaluation; high SNR; open-loop tanlock carrier recovery; phase tracking error; probability density function;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970326
