• DocumentCode
    1545561
  • Title

    A system for the dynamic characterization of microstructures

  • Author

    Burdess, James S. ; Harris, Alun J. ; Wood, David ; Pitcher, Robert J. ; Glennie, David

  • Author_Institution
    Dept. of Mech. Eng., Newcastle upon Tyne Univ., UK
  • Volume
    6
  • Issue
    4
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    322
  • Lastpage
    328
  • Abstract
    This paper describes a fully automated measurement system designed to evaluate the dynamic characteristics of micromechanical structures (millimeter dimensions). To validate the system, vibration measurements have been carried on two structures-a micromachined silicon cantilever and bridge-and the results are presented. Out-of-plane measurements show that for the cantilever, both the mode shapes and resonant frequencies agree with beam theory predictions. However, for the bridge structure, tension due to boron doping causes a change from beam-like behavior and a more complex model is required. Mode-shapes natural frequencies and modal damping are determined from data obtained by vibrating the structures using a piezoelectric mounting system and deriving the transfer function between the piezodrive voltage and beam vibrational velocity
  • Keywords
    automatic test equipment; measurement by laser beam; micromechanical devices; vibration measurement; B doping; MEMS; Si; automated measurement system; beam theory predictions; beam vibrational velocity; dynamic characterization; laser vibrometer; micromachined Si bridge; micromachined Si cantilever; micromechanical structures; microstructures; modal damping; mode shapes; natural frequencies; out-of-plane measurements; piezodrive voltage; piezoelectric mounting system; resonant frequencies; transfer function; vibration measurements; Boron; Bridge circuits; Frequency measurement; Micromechanical devices; Microstructure; Resonant frequency; Shape measurement; Silicon; Structural beams; Vibration measurement;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.650129
  • Filename
    650129