DocumentCode
1545626
Title
Point pattern matching by line segments and labels
Author
Wang, Wen-Hao ; Chen, Yung-Chang
Author_Institution
Inst. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
33
Issue
6
fYear
1997
fDate
3/13/1997 12:00:00 AM
Firstpage
478
Lastpage
479
Abstract
A point pattern matching method is proposed using the intrinsic invariant properties of a line segment which contains any two labelled points. Consequently, only the patterns which are judged to be affine-related are used to estimate the affine parameters so that efficient invariant image matching can be attained
Keywords
image matching; pattern matching; affine parameters; invariant image matching; label; line segment; point pattern matching;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19970337
Filename
585051
Link To Document