• DocumentCode
    1545643
  • Title

    IDDQ sensor circuit

  • Author

    Miura, Y.

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Tokyo Metropolitan Univ., Japan
  • Volume
    33
  • Issue
    6
  • fYear
    1997
  • fDate
    3/13/1997 12:00:00 AM
  • Firstpage
    482
  • Lastpage
    483
  • Abstract
    A novel IDDQ sensor circuit that reduces the voltage drop caused by the resistance of a fault is proposed. The circuit is simple to implement and simulation results show that the current measured by the circuit becomes more accurate as the fault current decreases
  • Keywords
    CMOS digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; IDDQ sensor circuit; fault current; resistance; simulation; voltage drop;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970334
  • Filename
    585054
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1545643