Title :
IDDQ sensor circuit
Author_Institution :
Dept. of Electron. & Inf. Eng., Tokyo Metropolitan Univ., Japan
fDate :
3/13/1997 12:00:00 AM
Abstract :
A novel IDDQ sensor circuit that reduces the voltage drop caused by the resistance of a fault is proposed. The circuit is simple to implement and simulation results show that the current measured by the circuit becomes more accurate as the fault current decreases
Keywords :
CMOS digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; IDDQ sensor circuit; fault current; resistance; simulation; voltage drop;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970334
