DocumentCode :
1545737
Title :
Stupid statistics reliability prediction
Volume :
48
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
105
Lastpage :
105
Keywords :
Arithmetic; Capacitors; Mathematics; Probability; Statistical analysis; Statistical distributions; Statistics; Testing; Uncertainty; Voltage;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1999.784264
Filename :
784264
Link To Document :
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