DocumentCode
1545776
Title
Testability analysis of analog systems
Author
Hemink, Gertjan J. ; Meijer, Berend W. ; Kerkhoff, Hans G.
Volume
9
Issue
6
fYear
1990
fDate
6/1/1990 12:00:00 AM
Firstpage
573
Lastpage
583
Abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
Keywords
analogue circuits; integrated circuit testing; linear integrated circuits; linear analog systems; nonlinear analog systems; rank-test algorithm; statistical methods; testability; Analog circuits; Circuit testing; Costs; Equations; Integrated circuit testing; Measurement errors; Measurement standards; Statistical analysis; System testing; Transmission line matrix methods;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.55186
Filename
55186
Link To Document