Title :
AFM analysis of step-edge Josephson junctions
Author :
Bulman, J.B. ; Salazar, O.O. ; Murduck, J.M.
Author_Institution :
Loyola Marymount Univ., Los Angeles, CA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We report on an analysis of step-edge Josephson junctions with a variety of different electrical behavior I/sub c/´s and IV curve characteristic shapes. We investigated a correlation between the shape of the IV curve and the morphology of the step-edge YBCO film concentrating on the sharpness of the step. Using Atomic Force Microscopy (AFM), determination of the film´s surface properties over the step were obtained. The steepness of the angle of the film over the step correlated with the behavior of the IV curve. When the average angle over the step was >23/spl deg/ the IV curve exhibited the resistively shunted junction [RSJ] shape. Less steep average angles <23/spl deg/ corresponded to flux flow-like IV curves.
Keywords :
Josephson effect; atomic force microscopy; barium compounds; critical currents; flux flow; high-temperature superconductors; superconducting device testing; superconducting thin films; surface structure; yttrium compounds; AFM analysis; I-V curve characteristic shapes; YBa/sub 2/Cu/sub 3/O/sub 7/; YBaCuO; angle steepness; critical currents; film morphology; film surface properties; flux flow-like I-V curves; resistively shunted junction shape; step sharpness; step-edge Josephson junctions; Grain boundaries; Josephson junctions; Shape; Voltage; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
