DocumentCode :
1545927
Title :
Direct temporal reconstruction of picosecond pulse by cross-correlation in semiconductor device
Author :
Hage, C.-H. ; Billard, F. ; Kibler, B. ; Finot, C. ; Millot, G.
Author_Institution :
Lab. Interdisciplinaire Carnot de Bourgogne, Univ. de Bourgogne, Dijon, France
Volume :
48
Issue :
13
fYear :
2012
Firstpage :
778
Lastpage :
780
Abstract :
Cross-correlation measurements using the two-photon absorption process in a semiconductor is experimentally demonstrated for two pulses of different wavelengths (shifted by ~200~nm) and durations (20 times ratio). These measurements were found to be highly repeatable and fully suitable for the determination of the temporal intensity profile of picosecond (ps) pulses.
Keywords :
correlation methods; electromagnetic wave absorption; intensity measurement; semiconductor devices; signal reconstruction; cross-correlation measurement; direct temporal reconstruction; picosecond pulse; semiconductor device; temporal intensity profile; two-photon absorption process; wavelength;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.1608
Filename :
6222099
Link To Document :
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