DocumentCode
1545927
Title
Direct temporal reconstruction of picosecond pulse by cross-correlation in semiconductor device
Author
Hage, C.-H. ; Billard, F. ; Kibler, B. ; Finot, C. ; Millot, G.
Author_Institution
Lab. Interdisciplinaire Carnot de Bourgogne, Univ. de Bourgogne, Dijon, France
Volume
48
Issue
13
fYear
2012
Firstpage
778
Lastpage
780
Abstract
Cross-correlation measurements using the two-photon absorption process in a semiconductor is experimentally demonstrated for two pulses of different wavelengths (shifted by ~200~nm) and durations (20 times ratio). These measurements were found to be highly repeatable and fully suitable for the determination of the temporal intensity profile of picosecond (ps) pulses.
Keywords
correlation methods; electromagnetic wave absorption; intensity measurement; semiconductor devices; signal reconstruction; cross-correlation measurement; direct temporal reconstruction; picosecond pulse; semiconductor device; temporal intensity profile; two-photon absorption process; wavelength;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2012.1608
Filename
6222099
Link To Document