Title :
Micro-Raman spectroscopy studies of Co doped Y-Ba-Cu-O thin films
Author :
Chamberlain, D. ; Sydow, J.P. ; Buhrman, R.A. ; Moeckly, B.H. ; Char, K.
Author_Institution :
Cornell Univ., Ithaca, NY, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We report on the micro-Raman spectroscopy study of thin films of YBa/sub 2/Cu/sub 3-x/Co/sub x/O/sub 7-/spl delta// grown by laser ablation. Depending on the growth pressure, the films are found to be either homogenous or inhomogeneous on a scale /spl Gt/2 /spl mu/m. In either case the films are, on average, oxygen deficient, but this deficit can be substantially improved, yielding /spl delta/ less than zero in thin film microstructures treated by oxygen electromigration. This indicates that the Co addition to such films impedes, but does not forbid the attainment of a relatively optimal degree of occupancy of the dopant, chain oxygen sites.
Keywords :
Raman spectra; barium compounds; cobalt; electromigration; high-temperature superconductors; pulsed laser deposition; superconducting thin films; yttrium compounds; Co addition; Co doped Y-Ba-Cu-O thin films; O deficiency; O electromigration; YBa/sub 2/(CuCo)/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3-x/Co/sub x/O/sub 7-/spl delta//; chain oxygen sites; dopant occupancy; homogenous films; inhomogeneous films; laser ablation; micro-Raman spectroscopy study; thin film microstructures; Electromigration; Josephson junctions; Laser ablation; Light scattering; Microscopy; Microstructure; Raman scattering; Spectroscopy; Transistors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on