Micro-Raman spectroscopy studies of Co doped Y-Ba-Cu-O thin films

Author

Chamberlain, D. ; Sydow, J.P. ; Buhrman, R.A. ; Moeckly, B.H. ; Char, K.

Author_Institution

Cornell Univ., Ithaca, NY, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3658

Lastpage

3661

Abstract

We report on the micro-Raman spectroscopy study of thin films of YBa/sub 2/Cu/sub 3-x/Co/sub x/O/sub 7-/spl delta// grown by laser ablation. Depending on the growth pressure, the films are found to be either homogenous or inhomogeneous on a scale /spl Gt/2 /spl mu/m. In either case the films are, on average, oxygen deficient, but this deficit can be substantially improved, yielding /spl delta/ less than zero in thin film microstructures treated by oxygen electromigration. This indicates that the Co addition to such films impedes, but does not forbid the attainment of a relatively optimal degree of occupancy of the dopant, chain oxygen sites.

Keywords

Raman spectra; barium compounds; cobalt; electromigration; high-temperature superconductors; pulsed laser deposition; superconducting thin films; yttrium compounds; Co addition; Co doped Y-Ba-Cu-O thin films; O deficiency; O electromigration; YBa/sub 2/(CuCo)/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3-x/Co/sub x/O/sub 7-/spl delta//; chain oxygen sites; dopant occupancy; homogenous films; inhomogeneous films; laser ablation; micro-Raman spectroscopy study; thin film microstructures; Electromigration; Josephson junctions; Laser ablation; Light scattering; Microscopy; Microstructure; Raman scattering; Spectroscopy; Transistors; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622211

Filename

622211