DocumentCode :
1546036
Title :
Origin of 1/f PM and AM noise in bipolar junction transistor amplifiers
Author :
Walls, Fred L. ; Ferre-Pikal, Eva S. ; Jefferts, Steven R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
44
Issue :
2
fYear :
1997
fDate :
3/1/1997 12:00:00 AM
Firstpage :
326
Lastpage :
334
Abstract :
In this paper we report the results of extensive research on phase modulation (PM) and amplitude modulation (AM) noise in linear bipolar junction transistor (BJT) amplifiers. BJT amplifiers exhibit 1/f PM and AM noise about a carrier signal that is much larger than the amplifiers thermal noise at those frequencies in the absence of the carrier signal. Our work shows that the 1/f PM noise of a BJT based amplifier is accompanied by 1/f AM noise which can be higher, lower, or nearly equal, depending on the circuit implementation. The 1/f AM and PM noise in BJTs is primarily the result of 1/f fluctuations in transistor current, transistor capacitance, circuit supply voltages, circuit impedances, and circuit configuration. We discuss the theory and present experimental data in reference to common emitter amplifiers, but the analysis can be applied to other configurations as well. This study provides the functional dependence of 1/f AM and PM noise on transistor parameters, circuit parameters, and signal frequency, thereby laying the groundwork for a comprehensive theory of 1/f AM and PM noise in BJT amplifiers. We show that in many cases the 1/f PM and AM noise can be reduced below the thermal noise of the amplifier.
Keywords :
1/f noise; amplitude modulation; bipolar transistor circuits; circuit noise; current fluctuations; microwave amplifiers; phase modulation; semiconductor device models; 1/f AM noise; 1/f PM noise; BJT modeling; amplitude modulation noise; bipolar junction transistor amplifiers; circuit configuration fluctuations; circuit impedance fluctuations; circuit supply voltage fluctuations; common emitter amplifiers; linear BJT amplifiers; microwave amplifier; phase modulation noise; signal frequency dependence; single pole approximation; transistor capacitance fluctuations; transistor current fluctuations; Amplitude modulation; Capacitance; Circuit noise; Fluctuations; Frequency; Low-noise amplifiers; Noise level; Noise reduction; Phase modulation; Phase noise;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.585117
Filename :
585117
Link To Document :
بازگشت