Title :
Adaptive Alternate Analog Test
Author :
Stratigopoulos, Haralampos-G ; Mir, Salvador
Author_Institution :
TIMA Lab., Grenoble INP-UJF, Grenoble, France
Abstract :
Adaptive test is a promising approach for test cost reduction. This article presents an adaptive test scheme for analog circuits that capitalizes on alternate test to achieve a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified and further action is taken.
Keywords :
analogue circuits; circuit testing; adaptive alternate analog test; analog circuit; test cost reduction; Adaptive systems; Correlation; Density measurement; Radio frequency; Standards; Testing; Training; Analog test; adaptive test; alternate test; defect filter; nonparametric statistics;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2012.2205480
