Title :
Modeling in the presence of switching uncertainties
Author :
Van Moer, Wendy ; Rolain, Yves ; Pintelon, Rik
Author_Institution :
Dept. ELEC/TW, Vrije Univ., Brussels, Belgium
fDate :
10/1/2001 12:00:00 AM
Abstract :
This paper presents a method that takes into account the switching uncertainties in the signal path of the measurement devices during the identification of device models. Switching phenomena in the measurement instrument, like switching attenuators, induce jumps in the measured input-output characteristic that can be much larger than the noise contributions. The proposed method eliminates the subsequent model error by considering these jumps as a signal path state dependent stochastic contribution
Keywords :
Bayes methods; electron device noise; maximum likelihood estimation; measurement theory; measurement uncertainty; network analysers; nonlinear systems; stochastic processes; switching transients; Bayes estimation; device models; identification; input-output characteristic; model error; nonlinear measurement; signal path; switching attenuators; switching uncertainties; Additive noise; Attenuation measurement; Attenuators; Frequency estimation; Maximum likelihood estimation; Noise measurement; Performance evaluation; Power system modeling; Stochastic resonance; Uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
