Ultrafast nonlinear refraction in integrated Fabry-Perot etalon containing polydiacetylene

Author

Bakarezos, M. ; Camacho, M.A. ; Blewett, I.J. ; Kar, A.K. ; Wherrett, B.S. ; Matsuda, H. ; Fukuda, T. ; Yamada, S. ; Rangel-Rojo, R. ; Katagi, H. ; Kasai, H. ; Okada, S. ; Nakanishi, H.

Author_Institution

Dept. of Phys., Heriot-Watt Univ., Edinburgh, UK

Volume

35

Issue

13

fYear

1999

fDate

6/24/1999 12:00:00 AM

Firstpage

1078

Lastpage

1079

Abstract

A nonlinear integrated Fabry-Perot etalon containing poly-1,6-dicarbazolyl-2,4-hexadiyne (poly-DCHD) nanocrystals has been fabricated. Time-resolved fringe shifts following picosecond excitation at 645 nm are monitored with a broadband white-light-continuum probe. The shift towards shorter wavelengths indicates a negative refractive index change. The magnitude of the refractive cross-section is found to be 1.6/spl times/10/sup -21/ cm/sup 3/, at a wavelength of /spl sim/700 nm, suggesting that polydiacetylene nanocrystal thin films are well suited for Fabry-Perot based all-optical switching devices.

Keywords

nonlinear optics; 645 to 700 nm; all-optical switching devices; broadband white-light-continuum probe; integrated Fabry-Perot etalon; nanocrystal thin films; negative refractive index change; poly-1,6-dicarbazolyl-2,4-hexadiyne; polydiacetylene; refractive cross-section; time-resolved fringe shifts; ultrafast nonlinear refraction;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:19990759

Filename

784539