• DocumentCode
    1546728
  • Title

    EMF probes calibration in a waveguide

  • Author

    Grudzinski, Eugeniusz ; Trzaska, Hubert

  • Author_Institution
    Inst. of Telecommun. & Acoust., Tech. Univ. Wroclaw, Poland
  • Volume
    50
  • Issue
    5
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1244
  • Lastpage
    1247
  • Abstract
    This paper is devoted to an estimation of electromagnetic field probe calibration error, while the calibration is performed within a waveguide, due to the presence of conducting walls of the waveguide and their influence on the calibrated probe´s transmittance. The presented estimations and measurements are performed for symmetric dipole antennas of different slenderness ratios. However, the approach is applicable to any type of electromagnetic field (EMF) standard and design of field probes
  • Keywords
    antenna testing; calibration; dipole antennas; field strength measurement; probes; EMF probes; calibration error; conducting walls; field probes; slenderness ratios; symmetric dipole antennas; transmittance; Calibration; Dipole antennas; Electromagnetic fields; Electromagnetic waveguides; Impedance; Parasitic capacitance; Probes; Reflection; Reflector antennas; TEM cells;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.963192
  • Filename
    963192