DocumentCode :
1546728
Title :
EMF probes calibration in a waveguide
Author :
Grudzinski, Eugeniusz ; Trzaska, Hubert
Author_Institution :
Inst. of Telecommun. & Acoust., Tech. Univ. Wroclaw, Poland
Volume :
50
Issue :
5
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
1244
Lastpage :
1247
Abstract :
This paper is devoted to an estimation of electromagnetic field probe calibration error, while the calibration is performed within a waveguide, due to the presence of conducting walls of the waveguide and their influence on the calibrated probe´s transmittance. The presented estimations and measurements are performed for symmetric dipole antennas of different slenderness ratios. However, the approach is applicable to any type of electromagnetic field (EMF) standard and design of field probes
Keywords :
antenna testing; calibration; dipole antennas; field strength measurement; probes; EMF probes; calibration error; conducting walls; field probes; slenderness ratios; symmetric dipole antennas; transmittance; Calibration; Dipole antennas; Electromagnetic fields; Electromagnetic waveguides; Impedance; Parasitic capacitance; Probes; Reflection; Reflector antennas; TEM cells;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.963192
Filename :
963192
Link To Document :
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