Title :
A 1.8-V digital-audio sigma-delta modulator in 0.8-μm CMOS
Author :
Rabii, Shahriar ; Wooley, Bruce A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
Oversampling techniques based on sigma-delta (ΣΔ) modulation offer numerous advantages for the realization of high-resolution analog-to-digital (A/D) converters in low-voltage environment. This paper examines the design and implementation of a CMOS ΣΔ modulator for digital-audio A/D conversion that operates from a single 1.8-V power supply. A cascaded modulator that maintains a large full-scale input range while avoiding signal clipping at internal nodes is introduced. The experimental modulator has been designed with fully differential switched-capacitor integrators employing different input and output common-mode levels and boosted clock drivers in order to facilitate low voltage operation. Precise control of common-mode levels, high power supply noise rejection, and low power dissipation are obtained through the use of two-stage, class A/AB operational amplifiers. At a sampling rate of 4 MHz and an oversampling ratio of 80, an implementation of the modulator in a 0.8-μm CMOS technology with metal-to-polycide capacitors and NMOS and PMOS threshold voltages of +0.65 V and -0.75 V, respectively, achieves a dynamic range of 99 dB at a Nyquist conversion rate of 50 kHz. The modulator can operate from supply voltages ranging from 1.5-2.5 V, occupies an active area of 1.5 mm2, and dissipates 2.5 mW from a 1.8-V supply
Keywords :
CMOS integrated circuits; audio equipment; cascade networks; integrating circuits; operational amplifiers; sampled data circuits; sigma-delta modulation; switched capacitor networks; 0.8 micron; 1.5 to 2.5 V; 2.5 mW; CMOS; Nyquist conversion rate; active area; boosted clock drivers; cascaded modulator; class A/AB operational amplifiers; common-mode levels; digital-audio sigma-delta modulator; dynamic range; full-scale input range; fully differential switched-capacitor integrators; high-resolution analog-to-digital converters; low-voltage environment; oversampling ratio; oversampling techniques; power dissipation; power supply noise rejection; sampling rate; threshold voltages; Analog-digital conversion; CMOS technology; Clocks; Delta-sigma modulation; Digital modulation; Driver circuits; Low voltage; Noise level; Power dissipation; Power supplies;
Journal_Title :
Solid-State Circuits, IEEE Journal of