DocumentCode :
1546819
Title :
Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide
Author :
Abbas, Zulkifly ; Pollard, Roger D. ; Kelsall, Robert W.
Author_Institution :
Phys. Dept., Universiti Putra Malaysia, Serdang, Malaysia
Volume :
50
Issue :
5
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
1334
Lastpage :
1342
Abstract :
The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented
Keywords :
dielectric loss measurement; dielectric waveguides; microwave measurement; permittivity measurement; rectangular waveguides; Ka-band; complex permittivity measurement; dielectric constant; dielectric loss tangent; effective refractive index; optimization method; rectangular dielectric waveguide; thickness measurement uncertainty; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Measurement uncertainty; Optimization methods; Permittivity measurement; Q measurement; Rectangular waveguides; Refractive index;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.963207
Filename :
963207
Link To Document :
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