DocumentCode :
1546868
Title :
Efficiency improvement in charge pump circuits
Author :
Wang, Chi-Chang ; Wu, Jiin-Chuan
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
32
Issue :
6
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
852
Lastpage :
860
Abstract :
Conventional charge pump circuits use a fixed switching frequency that leads to power efficiency degradation for loading less than the rated loading. This paper proposes a level shifter design that also functions as a frequency converter to automatically vary the switching frequency of a dual charge pump circuit according to the loading. The switching frequency is designed to be 25 kHz with 12 mA loading on both inverting and noninverting outputs. The switching frequency is automatically reduced when loading is lighter to improve the power efficiency. The frequency tuning range of this circuit is designed to be from 100 Hz to 25 kHz. A start-up circuit is included to ensure proper pumping action and avoid latch-up during power-up. A slow turn-on, fast turn-off driving scheme is used in the clock buffer to reduce power dissipation. The new dual charge pump circuit was fabricated in a 3-μm p-well double-poly single-metal CMOS technology with breakdown voltage of 18 V, the die size is 4.7×4.5 mm2. For comparison, a charge pump circuit with conventional level shifter and clock buffer was also fabricated. The measured results show that the new charge pump has two advantages: (1) the power dissipation of the charge pump is improved by a factor of 32 at no load and by 2% at rated loading of 500 Ω and (2) the breakdown voltage requirement is reduced from 19.2 to 17 V
Keywords :
CMOS analogue integrated circuits; DC-DC power convertors; automatic frequency control; circuit tuning; frequency convertors; integrated circuit design; integrated circuit measurement; 100 Hz to 25 kHz; 12 mA; 17 V; 18 V; 3 mum; automatic switching frequency variation; breakdown voltage; charge pump circuits; clock buffer; dc-dc converting circuit; die size; dual charge pump circuit; efficiency improvement; frequency converter; frequency tuning range; inverting outputs; latch-up avoidance; level shifter design; noninverting outputs; p-well double-poly single-metal CMOS technology; power dissipation; power efficiency; slow turn-on fast turn-off driving scheme; start-up circuit; CMOS technology; Charge pumps; Circuit optimization; Clocks; Current measurement; Degradation; Frequency conversion; Power dissipation; Switching converters; Switching frequency;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.585287
Filename :
585287
Link To Document :
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