• DocumentCode
    1547099
  • Title

    Forum

  • Author

    Burns, John J. ; Levine, Bernard ; Dies, Douglas ; Dwon, Larry ; Van Valkenburg, M.K. ; Glover, D.W. ; Morison, D.P.

  • Author_Institution
    President Solid State Testing, Inc. Burlington, Mass.
  • Volume
    14
  • Issue
    8
  • fYear
    1977
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    Readers are invited to comment in this department on material previously published in IEEE Spectrum; on the policies and operations of the IEEE; and on technical, economic, or social matters of interest to the electrical and electronics engineering profession. Short, concise letters are preferred. The Editor reserves the right to limit debate on controversial issues.
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1977.6501549
  • Filename
    6501549