DocumentCode
1547467
Title
Deposition of YBCO thin films on MgO buffer layer fabricated on Si substrates
Author
Shimakage, H. ; Kawakami, A. ; Wang, Z.
Author_Institution
Commun. Res. Lab., Kansai Adv. Res. Center, Kobe, Japan
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
1645
Lastpage
1648
Abstract
Epitaxial growth of YBCO thin films with a MgO buffer layer on Si[100] substrate is reported. The MgO thin film was deposited by RF magnetron sputtering, using a single crystal MgO target. The crystallization of the MgO thin films was found to be dependent on the substrate temperature and the sputtering gas mixture. The x-ray diffraction pattern showed that the MgO thin film grew epitaxially in the [200] orientation on the Si substrates in atmosphere containing nitrogen gas. YBCO thin films deposited by laser ablation on Si substrate buffered with MgO thin films had a c-axis orientation with a critical temperature of 82 K. The critical temperature was found to be dependent on the substrate temperature in depositing the MgO buffer layer. Also the surface morphology of MgO and YBCO thin films is discussed.
Keywords
X-ray diffraction; atomic force microscopy; barium compounds; high-temperature superconductors; magnesium compounds; pulsed laser deposition; sputter deposition; substrates; superconducting epitaxial layers; superconducting transition temperature; surface structure; vapour phase epitaxial growth; yttrium compounds; HTSC; MgO; MgO buffer layer; RF magnetron sputtering; Si; Si substrates; YBaCuO; YBaCuO thin films; c-axis orientation; critical temperature; crystallization; deposition; epitaxial growth; laser ablation; single crystal MgO target; sputtering gas mixture; substrate temperature; surface morphology; x-ray diffraction pattern; Buffer layers; Crystallization; Epitaxial growth; Radio frequency; Semiconductor thin films; Sputtering; Substrates; Temperature dependence; X-ray diffraction; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.784747
Filename
784747
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