DocumentCode
1547589
Title
An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter
Author
Simpson, Michael L. ; Britton, Charles L. ; Wintenberg, Alan L. ; Young, Glenn R.
Author_Institution
Oak Ridge Nat. Lab., TN, USA
Volume
32
Issue
2
fYear
1997
fDate
2/1/1997 12:00:00 AM
Firstpage
198
Lastpage
205
Abstract
The time interval measurement system of the WA-98 calorimeter is presented. This system consists of a constant fraction discriminator (CFD), a variable delay circuit, a time-to-amplitude converter (TAC), and a Wilkinson analog-to-digital converter (ADC) all realized in a 1.2-μm N-well CMOS process. These circuits measured the time interval between a reference logic signal and a photomultiplier tube (PMT) signal that had amplitude variations of 100:1 and 10-ns rise and fall times. The system operated over the interval range from 2 ns to 200 ns with a resolution of ~±300 ps including all walk and jitter components. The variable delay circuit allowed the CFD output to be delayed by up to 1 μs with a jitter component of ~0.04% of the delay setting. These circuits operated with a 5-V power supply. Although this application was in nuclear physics instrumentation, these circuits could also be useful in other scientific measurements, medical imaging, automatic test equipment, ranging systems, and industrial electronics
Keywords
CMOS integrated circuits; analogue-digital conversion; calorimeters; delay circuits; detector circuits; discriminators; jitter; mixed analogue-digital integrated circuits; nuclear electronics; nuclear instrumentation; time measurement; 1.2 micron; 2 to 200 ns; 5 V; N-well CMOS process; WA-98 calorimeter; Wilkinson ADC; analog-to-digital converter; constant fraction discriminator; integrated CMOS time interval measurement system; jitter component; photomultiplier tube signal; reference logic signal; subnanosecond resolution; time-to-amplitude converter; variable delay circuit; Analog-digital conversion; CMOS logic circuits; CMOS process; Computational fluid dynamics; Delay; Integrated circuit measurements; Jitter; Logic circuits; Photomultipliers; Time measurement;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.551911
Filename
551911
Link To Document