• DocumentCode
    1547589
  • Title

    An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter

  • Author

    Simpson, Michael L. ; Britton, Charles L. ; Wintenberg, Alan L. ; Young, Glenn R.

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • Volume
    32
  • Issue
    2
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    198
  • Lastpage
    205
  • Abstract
    The time interval measurement system of the WA-98 calorimeter is presented. This system consists of a constant fraction discriminator (CFD), a variable delay circuit, a time-to-amplitude converter (TAC), and a Wilkinson analog-to-digital converter (ADC) all realized in a 1.2-μm N-well CMOS process. These circuits measured the time interval between a reference logic signal and a photomultiplier tube (PMT) signal that had amplitude variations of 100:1 and 10-ns rise and fall times. The system operated over the interval range from 2 ns to 200 ns with a resolution of ~±300 ps including all walk and jitter components. The variable delay circuit allowed the CFD output to be delayed by up to 1 μs with a jitter component of ~0.04% of the delay setting. These circuits operated with a 5-V power supply. Although this application was in nuclear physics instrumentation, these circuits could also be useful in other scientific measurements, medical imaging, automatic test equipment, ranging systems, and industrial electronics
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calorimeters; delay circuits; detector circuits; discriminators; jitter; mixed analogue-digital integrated circuits; nuclear electronics; nuclear instrumentation; time measurement; 1.2 micron; 2 to 200 ns; 5 V; N-well CMOS process; WA-98 calorimeter; Wilkinson ADC; analog-to-digital converter; constant fraction discriminator; integrated CMOS time interval measurement system; jitter component; photomultiplier tube signal; reference logic signal; subnanosecond resolution; time-to-amplitude converter; variable delay circuit; Analog-digital conversion; CMOS logic circuits; CMOS process; Computational fluid dynamics; Delay; Integrated circuit measurements; Jitter; Logic circuits; Photomultipliers; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.551911
  • Filename
    551911