DocumentCode
1547638
Title
Confidence estimation methods for neural networks: a practical comparison
Author
Papadopoulos, Georgios ; Edwards, Peter J. ; Murray, Alan F.
Author_Institution
Dept. of Electron. & Electr. Eng., Edinburgh Univ., UK
Volume
12
Issue
6
fYear
2001
fDate
11/1/2001 12:00:00 AM
Firstpage
1278
Lastpage
1287
Abstract
Feedforward neural networks, particularly multilayer perceptrons, are widely used in regression and classification tasks. A reliable and practical measure of prediction confidence is essential. In this work three alternative approaches to prediction confidence estimation are presented and compared. The three methods are the maximum likelihood, approximate Bayesian, and the bootstrap technique. We consider prediction uncertainty owing to both data noise and model parameter misspecification. The methods are tested on a number of controlled artificial problems and a real, industrial regression application, the prediction of paper "curl". Confidence estimation performance is assessed by calculating the mean and standard deviation of the prediction interval coverage probability. We show that treating data noise variance as a function of the inputs is appropriate for the curl prediction task. Moreover, we show that the mean coverage probability can only gauge confidence estimation performance as an average over the input space, i.e., global performance and that the standard deviation of the coverage is unreliable as a measure of local performance. The approximate Bayesian approach is found to perform better in terms of global performance
Keywords
Bayes methods; automatic optical inspection; feedforward neural nets; maximum likelihood estimation; multilayer perceptrons; noise; paper industry; pattern classification; quality control; statistical analysis; approximate Bayesian approach; approximate Bayesian technique; bootstrap technique; classification; confidence estimation methods; data noise variance; feedforward neural networks; maximum likelihood technique; mean; mean coverage probability; model parameter misspecification; multilayer perceptrons; prediction interval coverage probability; prediction uncertainty; regression; standard deviation; Bayesian methods; Feedforward neural networks; Industrial control; Maximum likelihood estimation; Multi-layer neural network; Multilayer perceptrons; Neural networks; Predictive models; Probability; Testing;
fLanguage
English
Journal_Title
Neural Networks, IEEE Transactions on
Publisher
ieee
ISSN
1045-9227
Type
jour
DOI
10.1109/72.963764
Filename
963764
Link To Document