DocumentCode :
1547951
Title :
Inhomogeneous distribution of flux pinning strength and its effect on irreversibility line and vortex glass-liquid transition line in Bi-2212 tapes
Author :
Kiuchi, M. ; Matsushita, T. ; Nakayama, Y. ; Takase, N.
Author_Institution :
Graduate Sch. of Inf. Sci. & Electron. Eng., Kyushu Univ., Fukuoka, Japan
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
1892
Lastpage :
1895
Abstract :
The irreversibility line and the vortex glass-liquid transition line under a magnetic field parallel to the c-axis are investigated for silver-sheathed and dip-coated Bi-2212 tape wires. It is found that the two characteristic lines for silver-sheathed tape is well explained by the flux creep-flow model assuming the distribution of pinning strength with a single peak. On the other hand, general agreements are obtained for these characteristic lines and the critical current density between experiments and theory only when two peaks are assumed in the distribution of flux pinning strength for the dip-coated tape. The causative structure in the dip-coated tape for the peak at small strength in the distribution is discussed.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); flux creep; flux flow; flux pinning; high-temperature superconductors; strontium compounds; superconducting tapes; Ag; Bi-2212 tapes; BiSrCaCuO; HTSC; critical current density; dip-coated tape; flux creep-flow model; flux pinning strength; inhomogeneous distribution; irreversibility line; pinning strength; silver-sheathed tape; vortex glass-liquid transition line; Critical current density; Flux pinning; Magnetic field measurement; Magnetic fields; Superconducting devices; Superconducting films; Superconducting transition temperature; Temperature distribution; Temperature measurement; Type II superconductors;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784828
Filename :
784828
Link To Document :
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