Ion-beam milling of YBCO thin films and their characterization by time-resolved pump-probe method

Author

Hangyo, M. ; Nashima, S. ; Kawamura, M. ; Shikii, S. ; Tonouchi, M.

Author_Institution

Res. Center for Supercond. Mater. & Electron., Osaka Univ., Japan

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

1952

Lastpage

1955

Abstract

YBCO films are exposed to Ar ion beams in order to obtain flat surfaces and they are characterized by the time-resolved reflection pump-probe method excited with femtosecond optical pulses. The amplitudes of the reflectivity change of the ion-beam processed films are smaller than that of the as-grown ones and the decay time decreases by the ion-beam etching. These results are discussed in relation to the changes of the supercarrier density and the relaxation time of quasiparticles by the ion-beam milling.

Keywords

barium compounds; carrier density; high-temperature superconductors; reflectivity; sputter etching; superconducting thin films; time resolved spectra; yttrium compounds; Ar ion beams; YBaCuO; femtosecond optical pulses; flat surfaces; ion-beam etching; ion-beam milling; quasiparticle relaxation time; reflectivity; supercarrier density; thin films; time-resolved pump-probe method; Argon; Ion beams; Milling; Optical films; Optical pulses; Optical reflection; Reflectivity; Transistors; Ultrafast optics; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784843

Filename

784843