• DocumentCode
    1548128
  • Title

    Superconductivity in Bi/sub 2/Sr/sub 2/CuO/sub 6+/spl delta///(Sr,Ca)CuO/sub 2/ multilayers obtained by molecular beam epitaxy

  • Author

    Salvato, M. ; Attanasio, C. ; Carbone, G. ; Di Luccio, T. ; Prischepa, S.L. ; Russo, R. ; Maritato, L.

  • Author_Institution
    Dipt. di Fisica & INFM, Univ. degli Studi di Salerno, Baronissi, Italy
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    2006
  • Lastpage
    2009
  • Abstract
    Bi-based high temperature superconducting multilayers have been obtained by Molecular Beam Epitaxy (MBE) using a deposition method which consists of both co-deposition and growth interruption techniques. We have studied two kinds of structures in which a layer of Bi/sub 2/Sr/sub 2/CuO/sub 6+/spl delta// (2201) is alternately stacked by an insulating layer of CaCuO/sub 2/ or SrCuO/sub 2/ in order to obtain 2201/CaCuO/sub 2/ or 2201/SrCuO/sub 2/ multilayers. Reflection High Energy Electron Diffraction (RHEED), used to control the quality of the interfaces and the two-dimensional growth mode, gives evidence of an increase in the surface roughness increasing the number of periods. The layered structure has been confirmed comparing experimental and simulated X-ray spectra. The R vs. T curves of the 2201/SrCuO/sub 2/ multilayers present an onset and behave differently from those of the single phase samples with the same stoichiometry but they are not superconducting down to T=4.2 K. On the contrary, the 2201/CaCuO/sub 2/ samples are superconducting with critical temperatures strongly depending on the CaCuO/sub 2/ thickness.
  • Keywords
    X-ray spectra; bismuth compounds; calcium compounds; high-temperature superconductors; interface roughness; interface structure; molecular beam epitaxial growth; reflection high energy electron diffraction; strontium compounds; superconducting superlattices; superconducting transition temperature; 2201/CaCuO/sub 2/ multilayers; 2201/SrCuO/sub 2/ multilayers; 4.2 K; Bi-based high temperature superconducting multilayers; Bi/sub 2/Sr/sub 2/CuO/sub 6+/spl delta//; Bi/sub 2/Sr/sub 2/CuO/sub 6+/spl delta///(Sr,Ca)CuO/sub 2/ multilayers; Bi/sub 2/Sr/sub 2/CuO/sub 6/-SrCaCuO/sub 2/; CaCuO/sub 2/; CaCuO/sub 2/ thickness; MBE; RHEED; SrCuO/sub 2/; co-deposition; critical temperature; growth interruption; insulating layer; interfaces; layered structure; molecular beam epitaxy; reflection high energy electron diffraction; simulated X-ray spectra; stoichiometry; superconductivity; surface roughness; two-dimensional growth mode; Bismuth; Electrons; High temperature superconductors; Insulation; Molecular beam epitaxial growth; Nonhomogeneous media; Optical reflection; Strontium; Superconducting epitaxial layers; Superconductivity;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.784857
  • Filename
    784857