DocumentCode :
1548300
Title :
Non-linear microwave surface impedance of epitaxial HTS thin films in low DC magnetic fields
Author :
Kharel, A.P. ; Soon, K.H. ; Powell, J.R. ; Porch, A. ; Lancaster, M.J. ; Velichko, A.V. ; Humphreys, R.G.
Author_Institution :
Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
2121
Lastpage :
2124
Abstract :
We have carried out non-linear microwave (8 GHz) surface impedance measurements of three YBaCuO thin films in dc magnetic fields H/sub dc/ (parallel to c axis) up to 12 mT using a coplanar resonator technique. In zero dc field the three films, deposited by the same method, show a spread of low-power residual surface resistance, R/sub res/ and penetration depth, /spl lambda/(T=15 K) within a factor of 1.9. However, they exhibit dramatically different microwave field, H/sub rf/ dependences of the surface resistance, R/sub s/, but universal X/sub s/(H/sub rf/) dependence. Application of a dc field was found to affect not only absolute values of R/sub s/ and X/sub s/, but the functional dependences R/sub s/(H/sub rf/) and X/sub s/(H/sub rf/) as well. For some of the samples the dc field was found to decrease R/sub s/ below its zero-field low-power value.
Keywords :
barium compounds; electric impedance; high-temperature superconductors; penetration depth (superconductivity); superconducting epitaxial layers; surface conductivity; yttrium compounds; 0 T to 12 mT; 8 GHz; YBaCuO; coplanar resonator technique; epitaxial thin films; low DC magnetic fields; nonlinear microwave surface impedance; penetration depth; surface resistance; High temperature superconductors; Impedance measurement; Magnetic field measurement; Magnetic fields; Magnetic films; Microwave measurements; Resonance; Surface impedance; Surface resistance; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784886
Filename :
784886
Link To Document :
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