Title :
Influence of Fog Parameters on Withstand Voltage of Contaminated Insulators
Author :
Naito, Katsuhiko ; Kawaguchi, Toshiyuki ; Ito, Masanori ; Katsukawa, Hiroyuki ; Suzuki, Yoshihiro
Author_Institution :
NGK Insulators, Ltd, Nagoya, Japan
fDate :
3/1/1983 12:00:00 AM
Keywords :
Atomic measurements; Flashover; Insulation; Insulator testing; Logic testing; Sea surface; Surface contamination; Temperature dependence; Temperature distribution; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1983.5519243