Title :
Analysis of integrated quantum-well infrared photodetector and light-emitting diode for implementing pixelless imaging devices
Author :
Ryzhii, Victor ; Liu, H.C. ; Khmyrova, Irina ; Ryzhii, Maxim
Author_Institution :
Lab. of Comput. Solid State Phys., Aizu Univ., Wakamatsu, Japan
fDate :
9/1/1997 12:00:00 AM
Abstract :
The conversion of images into nonuniform distribution of the output current density in a multiple-quantum-well structure for an infrared pixelless imaging system is considered using an analytical device model. The nonuniform current, which reproduces the incident image, is converted back to a light-emitting diode emission image by the device considered here. The developed model takes into account transport processes responsible for the device operation. An explicit expression for the contrast transfer characteristic is derived as a function of the number of quantum wells (QWs) and the electron capture parameter. It is shown that the quality of the up-converted images (contrast and resolution) is improved with increasing number of QWs. The pixelless imaging devices under consideration can effectively convert long-wavelength infrared images into short-wavelength infrared or visible images with contrast transfer ratio close to unity
Keywords :
electron capture; image resolution; image sensors; infrared detectors; light emitting diodes; photodetectors; semiconductor quantum wells; transport processes; analytical device model; contrast transfer characteristic; contrast transfer ratio; e output current density; electron capture parameter; incident image; integrated quantum-well infrared photodetector; light-emitting diode; long-wavelength infrared images; multiple-quantum-well structure; nonuniform current; nonuniform distribution; pixelless imaging devices; short-wavelength infrared images; transport processes; Analytical models; Current density; Image analysis; Image converters; Infrared imaging; Optical imaging; Photodetectors; Pixel; Quantum well devices; Quantum wells;
Journal_Title :
Quantum Electronics, IEEE Journal of