YSZ buffer layers on large technical substrates

Author

Dzick, J. ; Wiesmann, J. ; Hoffmann, J. ; Heinemann, K. ; Garcia-Moreno, F. ; Isaev, A. ; Freyhardt, H.C. ; Lechner, W.

Author_Institution

Inst. fur Materialphys., Goettingen Univ., Germany

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

2248

Lastpage

2251

Abstract

The ion-beam-assisted deposition (IBAD) of yttria-stabilized zirconia (YSZ) films was extended to large technical substrates such as ceramic plates, metallic tapes and metallic tubes to serve as templates for high-current carrying Y-Ba-Cu-O films. These YSZ films are deposited with dual-Kaufman-ion-source equipment. The coating of technical substrates large in comparison to the ion sources requires special measures to provide YSZ films of homogeneous texture quality. With respect to the special growth mechanism of YSZ, a homogenization of the in-plane texture can be achieved by simple movement of the substrate. Up to now we have been able to produce YSZ films on ceramic substrates (10 cm/spl times/10 cm) with a homogeneous in-plane texture of 17/spl deg/ FWHM and on a Ni-tape (1 cm/spl times/50 cm) with a FWHM of 21/spl deg/. The main aspects of the growth mechanism-the influence of the nucleation, the improvement of texture with increasing film thickness and homoepitaxial effects-and the surface morphology are investigated in detail with transmission electron microscopy (TEM) and atomic force microscopy (AFM).

Keywords

atomic force microscopy; barium compounds; high-temperature superconductors; ion beam assisted deposition; nucleation; surface structure; texture; transmission electron microscopy; yttrium compounds; zirconium compounds; AFM; IBAD; Ni-tape; TEM; Y-Ba-Cu-O; Y/sub 2/O/sub 3/-ZrO/sub 2/; YSZ buffer layers; YSZ films; atomic force microscopy; ceramic plates; dual-Kaufman-ion-source equipment; film thickness; growth mechanism; high-current carrying Y-Ba-Cu-O films; homoepitaxial effects; homogeneous texture quality; in-plane texture; ion-beam-assisted deposition; large technical substrates; metallic tapes; metallic tubes; nucleation; surface morphology; templates; transmission electron microscopy; yttria-stabilized zirconia; Atomic force microscopy; Buffer layers; Ceramics; Coatings; Ion sources; Substrates; Surface morphology; Surface texture; Transmission electron microscopy; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784917

Filename

784917