DocumentCode :
1548577
Title :
Magnetic field dependence of transport properties of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// films on hastelloy substrates with YSZ buffer layers
Author :
Quinton, W.A.J. ; Doyle, R.A. ; Johnson, J.D. ; Liang, W.Y. ; Baudenbacher, F.
Author_Institution :
Cambridge Univ., UK
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
2312
Lastpage :
2315
Abstract :
Biaxially aligned yttria stabilised zirconia (YSZ) buffer layers were deposited on polycrystalline Hastelloy-C substrates using the inclined substrate deposition technique. In-plane aligned, c-axis oriented, YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// films were then grown onto these buffer layers. Resistively determined irreversibility lines of these films are presented, as well as critical current densities which have been extracted from measurements of E-J characteristics taken at 77.7 K for fields of up to 7 Tesla aligned either parallel or perpendicular to the ab-plane. Data are also presented showing the resistance as a function of the angle between the field and the c-axis. Strong pinning is observed both for fields parallel to the ab-plane (intrinsic pinning), and for fields parallel to the c-axis; the latter being due to either twin or grain boundaries.
Keywords :
barium compounds; critical current density (superconductivity); flux pinning; high-temperature superconductors; magnetoresistance; superconducting thin films; yttrium compounds; 7 T; 77.7 K; E-J characteristics; YBa/sub 2/Cu/sub 3/O/sub 7/-Y/sub 2/O/sub 3/ZrO/sub 2/; YSZ buffer layers; c-axis oriented films; critical current densities; grain boundaries; hastelloy substrates; inclined substrate deposition; intrinsic pinning; irreversibility lines; resistance; thin films; twin boundaries; Buffer layers; Critical current density; Current measurement; Data mining; Density measurement; Electrical resistance measurement; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetic properties;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784933
Filename :
784933
Link To Document :
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