Title :
Novel self-error-correction pulse width modulator for a class D hearing instrument amplifier
Author :
Tan, M.T. ; Chang, J.S. ; Cheng, Z. ; Tong, Y.C.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fDate :
10/1/2001 12:00:00 AM
Abstract :
The authors propose a pulse width modulator (PWM) for a hearing instrument (hearing aid) class D amplifier with emphases on low external component count, low cost, and low voltage and micropower operation. The PWM is based on a novel master-slave architecture that features a self-error-correction mechanism. This mechanism tunes the zero-input PWM output to 50% duty cycle, thereby reducing the output DC bias current of the amplifier; expensive post-fabrication calibration or trimming is unnecessary. The PWM is readily realised in a low-cost digital CMOS process and the input AC coupling capacitor is realised on-chip, reducing the external component count. The high matching requirement of the master and slave circuits is reduced by employing a novel switching methodology that periodically interchanges the critical (to matching) subcircuits of the master and slave circuits, without disrupting the continuous operation of the PWM. Computer simulations and measurements on prototype ICs show that the zero-input PWM output duty cycle error is ⩽2%, well within specifications, i.e. the DC output bias current (for RL=600 Ω) is I0=83 μA at VDD =2.5 V (or equivalent to I0=22 μA at VDD=1.3 V). The PWM circuit draws 25 μA at VDD=2.5 V (or equivalent to 10 μA at VDD=1.3 V)
Keywords :
CMOS analogue integrated circuits; audio-frequency amplifiers; biomedical electronics; error correction; hearing aids; low-power electronics; modulators; pulse width modulation; 1.3 to 2.5 V; 10 to 25 muA; 22 to 83 muA; 600 ohm; AC coupling capacitor; class D amplifier; computer simulation; digital CMOS process; hearing aid; hearing instrument; low voltage operation; master-slave architecture; micropower operation; self-error-correction pulse width modulator; switching methodology;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:20010417