Intergrain critical current density of Y123 bicrystal films grown by LPE method

Author

Takagi, T. ; Wen, J.G. ; Machi, T. ; Hashimoto, K. ; Takahashi, Y. ; Morishita, T. ; Hirabayashi, I. ; Kosyhizuka, N.

Author_Institution

Supercond. Res. Lab., ISTEC, Tokyo, Japan

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

2328

Lastpage

2331

Abstract

We succeeded in producing Y123 bicrystal films with straight grain boundaries by the LPE method. The Y123 bicrystal films were grown on MgO bicrystal substrates with 24/spl deg/ misorientation angle. TEM images show that the grain boundary consists of straight single facets of about 50 /spl mu/m length. J/sub c/ across the grain boundary at 77 K in zero magnetic field, 1.4/spl times/10/sup 4/ A/cm/sup 2/, was one order lower than that of the intragrain, /spl sim/10/sup 5/ A/ cm/sup 2/. This suppression rate of J/sub c/ in bicrystal films with tilt angle 24/spl deg/ is lower than that in films grown by PVD methods such as PLD. The normal resistance of the intergrain boundary is small, which indicates that the effective width of the straight interface is very narrow.

Keywords

barium compounds; bicrystals; critical current density (superconductivity); grain boundaries; superconducting epitaxial layers; transmission electron microscopy; yttrium compounds; LPE; MgO; MgO bicrystal substrate; TEM images; YBa/sub 2/Cu/sub 3/O/sub 7/; bicrystal films; intergrain critical current density; misorientation angle; straight grain boundaries; straight single facets; Conducting materials; Critical current density; Grain boundaries; Magnetic films; Magnetic materials; Optical films; Optical microscopy; Substrates; Superconducting films; Superconductivity;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784937

Filename

784937