• DocumentCode
    1548613
  • Title

    Simple digital test approach for embedded charge-pump phase-locked loops

  • Author

    Burbidge, M.J. ; Richardson, A.M.

  • Author_Institution
    Centre for Microsyst. Eng., Lancaster Univ., UK
  • Volume
    37
  • Issue
    22
  • fYear
    2001
  • fDate
    10/25/2001 12:00:00 AM
  • Firstpage
    1318
  • Lastpage
    1319
  • Abstract
    Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry
  • Keywords
    automatic testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; phase locked loops; production testing; BIST; automated test approach; charge-pump phase-locked loops; digital test approach; embedded charge-pump PLLs; high volume production testing; mixed signal building block; noninvasive production testing; onchip circuitry;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20010914
  • Filename
    964268
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1548613