Title :
Simple digital test approach for embedded charge-pump phase-locked loops
Author :
Burbidge, M.J. ; Richardson, A.M.
Author_Institution :
Centre for Microsyst. Eng., Lancaster Univ., UK
fDate :
10/25/2001 12:00:00 AM
Abstract :
Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry
Keywords :
automatic testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; phase locked loops; production testing; BIST; automated test approach; charge-pump phase-locked loops; digital test approach; embedded charge-pump PLLs; high volume production testing; mixed signal building block; noninvasive production testing; onchip circuitry;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20010914
