• DocumentCode
    1548679
  • Title

    Propagation characteristics of high-T/sub c/ superconducting interconnect for VLSI packaging predicted by a generalized two-fluid model

  • Author

    Jinfeng Kang ; Ruqi Han ; Xiaoyan Liu ; Yangyuan Wang

  • Author_Institution
    Inst. of Microelectron., Beijing Univ., China
  • Volume
    7
  • Issue
    1
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    A generalized two-fluid model is used to analyze the propagation characteristics of high-Tc superconducting interconnects for very large scale integration (VLSI) packaging. The comparisons for surface impedance of YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) single crystals and thin films show data are in good agreement with the generalized two-fluid model. Based on the generalized two-fluid model, the temperature- and frequency-dependences of the attenuation constant are calculated, the transient responses of a pulse transmitted on a high-Tc superconducting interconnect are simulated, and a simple semi-empirical expression for rise time is given. The results based on the generalized two-fluid model predict an optimum operation temperature range for YBCO interconnect near at liquid nitrogen temperature.
  • Keywords
    VLSI; barium compounds; high-temperature superconductors; integrated circuit interconnections; integrated circuit packaging; superconducting integrated circuits; superconducting interconnections; yttrium compounds; VLSI packaging; YBCO; YBa/sub 2/Cu/sub 3/O/sub 7/; attenuation constant; generalized two-fluid model; high-T/sub c/ superconducting interconnect; propagation characteristics; pulse transmission; rise time; single crystal; surface impedance; thin film; transient response; Attenuation; Crystals; Frequency; Packaging; Predictive models; Superconducting thin films; Surface impedance; Temperature distribution; Very large scale integration; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.585885
  • Filename
    585885