DocumentCode
1548679
Title
Propagation characteristics of high-T/sub c/ superconducting interconnect for VLSI packaging predicted by a generalized two-fluid model
Author
Jinfeng Kang ; Ruqi Han ; Xiaoyan Liu ; Yangyuan Wang
Author_Institution
Inst. of Microelectron., Beijing Univ., China
Volume
7
Issue
1
fYear
1997
fDate
3/1/1997 12:00:00 AM
Firstpage
27
Lastpage
32
Abstract
A generalized two-fluid model is used to analyze the propagation characteristics of high-Tc superconducting interconnects for very large scale integration (VLSI) packaging. The comparisons for surface impedance of YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) single crystals and thin films show data are in good agreement with the generalized two-fluid model. Based on the generalized two-fluid model, the temperature- and frequency-dependences of the attenuation constant are calculated, the transient responses of a pulse transmitted on a high-Tc superconducting interconnect are simulated, and a simple semi-empirical expression for rise time is given. The results based on the generalized two-fluid model predict an optimum operation temperature range for YBCO interconnect near at liquid nitrogen temperature.
Keywords
VLSI; barium compounds; high-temperature superconductors; integrated circuit interconnections; integrated circuit packaging; superconducting integrated circuits; superconducting interconnections; yttrium compounds; VLSI packaging; YBCO; YBa/sub 2/Cu/sub 3/O/sub 7/; attenuation constant; generalized two-fluid model; high-T/sub c/ superconducting interconnect; propagation characteristics; pulse transmission; rise time; single crystal; surface impedance; thin film; transient response; Attenuation; Crystals; Frequency; Packaging; Predictive models; Superconducting thin films; Surface impedance; Temperature distribution; Very large scale integration; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.585885
Filename
585885
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