Title :
Structural and compositional defects in high-J/sub c/ Bi-2223 tapes
Author :
Holesinger, T.G. ; Bingert, J.F. ; Willis, J.O. ; Qi Li ; Parrella, R.D. ; Teplitsky, M.D. ; Rupich, M.W. ; Riley, G.N., Jr.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
High critical current density (J/sub c/) Bi-2223 multifilamentary tapes (55 kA/cm/sup 2//spl les/J/sub c//spl les/70 kA/cm/sup 2/, 77 K and self-field) have been examined by transmission electron microscopy. Filament microstructures within the tapes consist of two distinct regions: a highly aligned, dense colony structure (brick-wall) near the silver interface and a porous, poorly-textured interior region (impurity channel) that contains significantly more secondary phases. Quantitative compositional analysis clearly showed a heterogeneity in the Bi-2223 composition throughout the tapes. Spatial variations in composition were especially prevalent in the vicinity of secondary phases. Potential current limiting microstructures or defects were categorized depending upon the length scale at which they would operate. Macroscale defects were defined as potentially limiting current flow between regions of a filament. Mesoscale defects affect current flow between adjoining colonies. And finally, microscale defects were classified as potentially limiting current flow within a colony structure.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); crystal defects; crystal microstructure; high-temperature superconductors; silver; strontium compounds; superconducting tapes; transmission electron microscopy; 77 K; Ag-Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 7/; compositional defects; dense colony structure; filament microstructures; high critical current density; high temperature superconductor; high-J/sub c/ Bi-2223 tapes; porous poorly-textured interior region; potential current limiting microstructures; potentially limiting current flow; secondary phases; self-field; structural defects; transmission electron microscopy; Critical current density; Impurities; Microstructure; Multifilamentary superconductors; Silver; Superconducting filaments and wires; Superconducting films; Superconducting magnets; Superconducting transmission lines; Transmission electron microscopy;
Journal_Title :
Applied Superconductivity, IEEE Transactions on