Title :
Variational Algorithms to Remove Stationary Noise: Applications to Microscopy Imaging
Author :
Fehrenbach, J. ; Weiss, P. ; Lorenzo, C.
Author_Institution :
IMT-UMR5219 Lab., Univ. of Toulouse, Toulouse, France
Abstract :
A framework and an algorithm are presented in order to remove stationary noise from images. This algorithm is called variational stationary noise remover. It can be interpreted both as a restoration method in a Bayesian framework and as a cartoon+texture decomposition method. In numerous denoising applications, the white noise assumption fails. For example, structured patterns such as stripes appear in the images. The model described here addresses these cases. Applications are presented with images acquired using different modalities: scanning electron microscope, FIB-nanotomography, and an emerging fluorescence microscopy technique called selective plane illumination microscopy.
Keywords :
focused ion beam technology; image denoising; image texture; scanning electron microscopy; white noise; Bayesian framework; FIB-nanotomography; cartoon+texture decomposition method; denoising applications; fluorescence microscopy technique; microscopy imaging; scanning electron microscope; selective plane illumination microscopy; stationary noise; variational algorithms; white noise; Mathematical model; Numerical models; Scanning electron microscopy; Standards; White noise; Atomic force microscope; convex optimization; light sheet fluorescence microscope; nanotomography; non linear filtering; primal-dual scheme; scanning electron microscope; stationary noise; stripe removal; texture-geometry decomposition; total variation; Algorithms; Animals; Computer Simulation; Fourier Analysis; Humans; Image Processing, Computer-Assisted; Microscopy; Models, Theoretical; Oryzias; Papio; Tomography;
Journal_Title :
Image Processing, IEEE Transactions on
DOI :
10.1109/TIP.2012.2206037