DocumentCode :
1548795
Title :
Guest editorial
Author :
Hess, Christopher
Author_Institution :
PDF Solutions, Inc.
Volume :
14
Issue :
4
fYear :
2001
Firstpage :
301
Lastpage :
301
Keywords :
Chip scale packaging; Circuit simulation; Circuit testing; Data mining; Electron Devices Society; Integrated circuit yield; Manufacturing processes; Microelectronics; Semiconductor device manufacture; Semiconductor device testing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2001.964316
Filename :
964316
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1548795
