• DocumentCode
    1548910
  • Title

    Determination of vortex motion characteristics, effective thickness and dynamic resistance in very thin YBaCuO bilayer structures

  • Author

    Pannetier, M. ; Bernstein, P. ; Lecoeur, P. ; Riou, O. ; Doan, T.D. ; Hamet, J.F.

  • Author_Institution
    Site Univ. de Cherbourg, Octeville, France
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    2635
  • Lastpage
    2638
  • Abstract
    In order to develop superconducting flux flow devices, we have measured the electrical characteristics of microbridges made from bilayers comprised of a conductive capping layer deposited on a very thin YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// film. In the flux creep regime, these structures show a low and quasi-constant depinning-to-critical current ratio and a high maximum vortex velocity. As expected from these features, the microbridges can be driven in the flux flow regime in the vicinity of T/sub c/. In the flux flow regime, surprisingly, the dynamic resistance is not an increasing function of temperature and shows a value which is in the range of the normal-state resistance at the onset of the superconductive transition.
  • Keywords
    barium compounds; critical currents; flux creep; flux flow; high-temperature superconductors; superconducting microbridges; superconducting thin films; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/; conductive capping layer; critical current; dynamic resistance; effective thickness; flux creep; flux flow; flux flow devices; microbridges; superconductive transition; thin YBaCuO bilayer structures; vortex motion; vortex velocity; Conductive films; Conductivity measurement; Creep; Electric variables; Electric variables measurement; Fluid flow measurement; Superconducting devices; Superconducting epitaxial layers; Superconducting films; Superconducting transition temperature;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.785027
  • Filename
    785027