DocumentCode :
1549051
Title :
Effects of Cr content on the interruption ability of CuCr contact materials
Author :
Li, Wangpei ; Thomas, Robert L. ; Smith, R. Kirkland
Author_Institution :
Cutler-Hammer Inc., Horseheads, NY, USA
Volume :
29
Issue :
5
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
744
Lastpage :
748
Abstract :
The effects of Cr content in CuCr contact materials, especially on high current interruption, have mostly been examined in experimental chambers rather than in actual vacuum interrupters (VIs). Possible interactions of the contacts with their surroundings, both electromechanical and gaseous, may require commercial VIs for a more realistic test determination of the effects of Cr content on the overall performance. In this work, the Cr content in CuCr contacts is varied from 5 wt% to 75 wt% and tested in our 38-kV axial magnetic field (AMF) type VIs. The material properties of electrical conductivity, hardness and total VI resistance are measured as a function of the Cr content. AC and impulse voltage withstand capabilities are tested before and after short-circuit current interruption tests. Contact erosion behavior is examined with VIs subjected to only a half cycle arcing duty. Results show that for this particular AMF VI design, a 30 wt% Cr content gives the best current interruption performance
Keywords :
chromium alloys; copper alloys; electrical conductivity; hardness; short-circuit currents; vacuum arcs; vacuum interrupters; 38 kV; AC voltage; Cr; Cr content; CuCr; CuCr contact materials; axial magnetic field; contact erosion behavior; electrical conductivity; half cycle arcing; hardness; high current interruption; impulse voltage withstand characteristics; short-circuit current interruption; total resistance; vacuum interrupters; Chromium; Conductivity measurement; Contacts; Electric resistance; Electric variables measurement; Electrical resistance measurement; Impulse testing; Interrupters; Magnetic field measurement; Material properties;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.964467
Filename :
964467
Link To Document :
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