• DocumentCode
    15491
  • Title

    Feedback-Controlled MEMS Force Sensor for Characterization of Microcantilevers

  • Author

    Moore, Steven Ian ; Coskun, M. Bulut ; Alan, Tuncay ; Neild, Adrian ; Moheimani, S.O.R.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
  • Volume
    24
  • Issue
    4
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    1092
  • Lastpage
    1101
  • Abstract
    This paper outlines the design and characterization of a setup used to measure the stiffness of microcantilevers and other small mechanical devices. Due to the simplicity of fabrication, microcantilevers are used as the basis for a variety of mechanical sensor designs. In a range of applications, knowledge of the stiffness of microcantilevers is essential for the accurate calibration of the sensors in which they are used. Stiffness is most commonly identified through measurement of the microcantilever´s resonance frequency, which is applied to an empirically derived model. This paper uses a microelectromechanical system (MEMS)-based force sensor to measure the forces produced by a microcantilever when deformed and a piezoelectric tube-based nanopositioner to displace the microcantilever. A method of calibrating the force sensor is presented that takes advantage of the lumped nature of the mechanical system and the nonlinearity of MEMS electrostatic drives.
  • Keywords
    calibration; cantilevers; electric drives; electrostatic devices; force measurement; force sensors; frequency measurement; microfabrication; microsensors; nanosensors; piezoelectric transducers; position measurement; MEMS electrostatic drive; calibration; feedback-controlled MEMS force sensor; force measurement; mechanical sensor design; microcantilever; microelectromechanical system; piezoelectric tube-based nanopositioner; resonance frequency measurement; stiffness measurement; Equations; Force; Force sensors; Mathematical model; Micromechanical devices; Nanopositioning; Microelectromechanical systems; displacement measurement; force measurement; microcantilevers; nanopositioning; stiffness identification; stiffness identification.;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2014.2382648
  • Filename
    7008429