• DocumentCode
    1549120
  • Title

    Efficiency improvement of high-pressure microplasma by an electron beam

  • Author

    Dastgeer, Sheikh ; Lee, Jae Koo ; Kim, Hyun Chul ; Kim, Young Hwan

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
  • Volume
    29
  • Issue
    5
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    837
  • Lastpage
    843
  • Abstract
    Efficiency has been a paramount issue for the past few years in high pressure microplasma devices such as Plasma Display Panels (PDP). In order to achieve a better efficiency, a novel method based upon electron beam emission has been investigated by a two-dimensional (2-D) fluid simulation. The injection of electron beam inside the PDP cell gives rise to substantially large density of excited Xe species (Xe*), while reducing ionized xenon (Xe+) and electron densities. This, in turn, enhances the efficiency, luminance, and reduces power consumption. The primary reason for generating more Xe* species could be attributed to the formation of low electric field region inside the PDP cell, which consequently improves its operational efficiency. The validity of 2-D fluid simulation results is ensured through a qualitative comparison between the one-dimensional fluid and the kinetic results
  • Keywords
    discharges (electric); plasma devices; plasma displays; plasma pressure; plasma simulation; plasma-beam interactions; 2-D fluid simulation; Xe; Xe*; Xe+; efficiency improvement; electron beam emission; electron beam injection; electron densities; excited Xe species; high pressure microplasma devices; low electric field region; luminance; one-dimensional fluid; operational efficiency; plasma display panels; power consumption; two-dimensional fluid simulation; Discharges; Electron beams; Energy consumption; Kinetic theory; Particle beams; Plasma displays; Plasma simulation; TV; Two dimensional displays; Xenon;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.964484
  • Filename
    964484