• DocumentCode
    1549215
  • Title

    Effect of Tunnel Recombination Junction on Crossover Between the Dark and Illuminated Current–Voltage Curves of Tandem Solar Cells

  • Author

    Bills, Braden ; Liao, Xianbo ; Galipeau, David W. ; Fan, Qi Hua

  • Author_Institution
    Department of Electrical Engineering and Computer Science, South Dakota State University , Brookings, SD, USA
  • Volume
    59
  • Issue
    9
  • fYear
    2012
  • Firstpage
    2327
  • Lastpage
    2330
  • Abstract
    The tunnel recombination junction (TRJ) quality of an amorphous silicon (a-Si)-based tandem junction solar cell can have a significant impact on its performance, where crossover between the dark and illuminated current–voltage curves of a tandem cell indicates a TRJ with poor quality. Therefore, it is critical to be able to understand the TRJ characteristics in order to optimize the tandem solar cell performance. A simulation approach requiring a few data points was used to quantify the TRJ quality. The uniform field collection model was modified to account for parasitic losses due to the TRJ, which are a voltage drop across the TRJ and a series resistance due to the TRJ. Simulation results using the TRJ model are in good agreement with experimental data. The TRJ model can be a useful tool to aid in the optimization of a-Si-based multijunction solar cells.
  • Keywords
    Amorphous silicon; Data models; PIN photodiodes; Photovoltaic cells; Resistance; Crossover; modeling; simulation; tandem solar cell; tunnel recombination junction (TRJ);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2203137
  • Filename
    6226840