DocumentCode
1549309
Title
Development of a microprocessor-based four probe DC resistivity setup for T c measurement of superconducting materials
Author
Pragasam, R. ; Murthy, V.R.K. ; Viswanathan, B. ; Natarajan, T.S.
Author_Institution
Dept. of Phys., Indian Inst. of Technol., Madras, India
Volume
39
Issue
5
fYear
1990
fDate
10/1/1990 12:00:00 AM
Firstpage
792
Lastpage
795
Abstract
The design of a microprocessor-based resistivity measurement system for high transition temperature (T c) superconducting materials is described. This design includes interfacing an Intel 8085 microprocessor system with an IBM-compatible personal computer (PC) through RS-232C serial communication. This design is used to measure resistivity for superconducting samples of YBa2Cu 3O7-x and strontium/potassium substituted YBa2Cu3O7-x. A correction method is described for the parameters whose values are changing throughout the measurement period to minimize the measurement errors
Keywords
barium compounds; computer interfaces; computerised instrumentation; electrical conductivity measurement; high-temperature superconductors; microcomputer applications; superconducting transition temperature; yttrium compounds; IBM-compatible personal computer; Intel 8085 microprocessor; RS-232C serial communication; Tc measurement; YBa2Cu3O7-x; YBaKCuO; YBaSrCuO; correction; four probe DC measurement method; high temperature superconductors; interfacing; measurement errors; microprocessor-based resistivity measurement; superconducting materials; Conductivity; Convergence; Damping; Frequency; Microprocessors; Parameter estimation; Probes; Superconducting device noise; Superconducting materials; Superconducting transition temperature;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.58628
Filename
58628
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